Science. Service. Solutions.

Instrumentation

SEM-EDX

ASPEX 3025 Integrated SEM/EDX system

The scanning electron microscope (SEM) utilizes a focused beam of electrons, rather than light, to obtain a magnified image of an object. This allows for detailed surface imaging at a much higher magnification (up to 7 nm in diameter) than a compound microscope. Integrated with this imaging capability, is an energy dispersive x-ray (EDX) detector which enables detailed elemental analysis of the observed sample (ie. glass, metal, processing residues). The ASPEX software suite, Perception, provides a powerful productivity platform to process these advanced imaging and microanalysis capabilities of the ASPEX 3025.

Mini FT-IR

Smiths Scientific IdentifyIR System

Our Fourier transform infra-red (FT-IR) spectrometer is used for the rapid detection of unknown chemicals and materials. It utilizes a diamond attenuated total reflectance (DATR) sampling interface which allows for the analysis of any solid or liquid sample. The coupled SpectrAssist software enables detailed library searches and comparisons to acquired spectral data of fibers, food additives and contaminants, packaging materials, and other questioned substances.

Micro FT-IR

Smiths Scientific IlluminatIR II Microscope

The infra-red microspectrometer brings the power of chemical analysis to the conventional light microscope. For imaging and identification of small particles (≤1 mm), the Illuminator II combines advanced microscopy techniques and an infra-red microprobe. Typical applications for this system include visual and infra-red analysis of powders, crystals, coatings, fibers, polymers, glass, geological materials, and food ingredient particulates.

Contact us to see what our Food Forensics services can do for you.

Alteca Ltd. | 731 McCall Road | Manhattan, KS 66502 | T: 785.537.9773 | F: 785.537.1800 | alteca@alteca.com

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